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Three Dimensions and Implications of Atomic Force Microscopy (AFM) Technology Evolution: Focusing on the Case of Park Systems Corp.

Jeong Hyeon Lee1 · Sang Gil Jeon1

1 Hanyang University

Published: January 2025 · Vol. 29, No. 1 · pp. 31-61

DOI: https://doi.org/10.17287/kbr.2025.29.1.31

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